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Hitoshi ABIKO

Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability
Masayuki MIZUNO  Hitoshi ABIKO  Koichiro FURUTA  Isami SAKAI  Masakazu YAMASHINA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/09/20
Vol. E81-C  No. 9  pp. 1463-1472
Type of Manuscript: Special Section PAPER (Special Issue on Novel VLSI Processor Architectures)
Category: 
Keyword: 
low-threshold voltage,  leakage current,  supply-voltage fluctuation,  supply-voltage control,  low power dissipation, 
  Summary |  Full Text:PDF (972.4KB)