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| IEICE TRANSACTIONS on Information and Systems
Archive Index |
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| Online ISSN :
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| Volume E87-D No.3 (Publication Date:2004/03/01)
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Special Section on Test and Verification of VLSI |
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pp.601-608 PAPER-Memory Testing Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults Jin-Fu LI
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Summary |
Full Text:PDF
(436.7KB)
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Special Section on Cellular Automata |
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Regular Section |
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