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Near-Field Optical Investigations of Photonic Crystal Microresonators
Ben C. BUCHLER
Patrick KRAMPER
Maria KAFESAKI
Costas M. SOUKOULIS
Vahid SANDOGHDAR
Publication
IEICE TRANSACTIONS on Electronics Vol.E87-C No.3 pp.371-377
Publication Date: 2004/03/01
Online ISSN:
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Photonic Crystals and Their Device Applications)
Category: INVITED
Keyword:
photonic crystal,
scanning near-field optical microscopy,
SNOM,
point defect,
microresonator,
Full Text: PDF(1.8MB)
Summary:
We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.
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